期刊
SURFACE AND INTERFACE ANALYSIS
卷 -, 期 -, 页码 -出版社
WILEY
DOI: 10.1002/sia.7276
关键词
adventitious carbon; component spectra; linear least squares; platinum; XPS
This article discusses the impact of adventitious carbon contamination on Pt and presents a method to determine the amount of each component, including the contamination itself, by fitting the peak spectra using linear mathematics after ion beam cleaning of the samples.
Adventitious carbon contaminations are not only omnipresent and used for charge referencing of XPS spectra but also can alter the apparent presence of the element peaks that span over the large spectral window of binding energies. This Insight note describes the effect of an adventitious contamination layer on Pt and presents, in brief, the approach whereby the component spectra are derived for ion beam cleaned Pt samples that can then utilize linear mathematics to peak fit said spectra thus quantifying the amount of each component including that assigned to the contamination itself of Pt metal.
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