4.7 Article

Three-sensor 2ω method with multi-directional layout: A general methodology for measuring thermal conductivity of solid materials

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PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.ijheatmasstransfer.2023.124878

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Anisotropic thermal conductivity; 2 omega method; Three-sensor layout; Thermal conductivity measurement

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This article introduces a new method for accurately measuring the isotropic or anisotropic thermal conductivity of solid materials using three sensor groups and the Intersection Method. By eliminating errors introduced by the uncertainties of thermal resistance, this method provides a comprehensive and versatile solution.
Anisotropic thermal transport plays a key role in both theoretical study and engineering practice of heat transfer, but accurately measuring anisotropic thermal conductivity remains a significant challenge. To address this issue, we propose the three-sensor 2 omega method in this study, which is capable of accurately measuring the isotropic or anisotropic thermal conductivity of solid materials. In this method, several three-sensor groups following the design guidelines are fabricated upon the sample along different characteristic directions, and each group consists of three parallel metal sensors with unequal widths and distances optimally designed based on sensitivity analysis. Among the three sensors, the outer two serve as AC heaters and the middle one as a DC detector. The 2 omega voltage signals across the detector in each three-sensor group are measured, and then the data are processed by the proposed Intersection Method to derive thermal conductivities along directions of interest. The application of the detector's 2 omega instead of the heater's 3 omega voltage signals eliminates errors introduced by the uncertainties of thermal resistance in superficial structures (metal layer, insulation layer, interface, etc.). Meanwhile, by replacing the fitting algorithm with the Intersection Method, the local optimum trap of multivariate fitting is avoided. To verify the accuracy and reliability, four typical monocrystalline semiconductors, i.e., Si, GaN, AlN, and beta-Ga2O3, are measured, and the results are consistent with the literature. This method will provide a comprehensive and versatile solution for the thermal conductivity measurements of solid materials.

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