期刊
INTEGRATION-THE VLSI JOURNAL
卷 94, 期 -, 页码 -出版社
ELSEVIER
DOI: 10.1016/j.vlsi.2023.102109
关键词
RISC-V; Out-of-order; Issue queue; Withering logic
This paper proposes a Withering-logic Based Issue Queue (W-IQ) to improve the performance of RISC-V processors by increasing IPC and reducing delay. Experimental results show that W-IQ outperforms traditional methods in terms of running time and delay.
The rise of RISC-V Instruction Set Architecture (ISA) motivates research on improving the performance of the RISC-V processors. Issue Queue (IQ) is an essential factor affecting the Instructions Per Clock (IPC) and delay. This paper proposes a Withering-logic Based Issue Queue (W-IQ) to improve IPC while reducing the delay. We further evaluate the IPC of W-IQ with the XCVU440 FPGA. The average running time of the SPEC2006 of the W-IQ is 34% shorter than that of the non-compaction IQ with position-based selection logic. Furthermore, for a 65 nm CMOS process, the W-IQ delay is 27% lower than compaction IQ with the serial age-aware selection logic.
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