期刊
IEEE ACCESS
卷 11, 期 -, 页码 137328-137342出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/ACCESS.2023.3339549
关键词
Fault diagnosis; Hybrid electric vehicles; hybrid electric vehicle (HEV); insulated-gate bipolar transistor (IGBT); open-circuit fault; permanent magnet synchronous motor (PMSM); voltage source inverter (VSI)
This article proposes a hybrid fault diagnosis approach to detect and address open-circuit faults in IGBTs used in electric drive-motor systems of hybrid electric vehicles. The method combines model-based and data-driven techniques, utilizing phase voltage analysis and the modified multi-class support vector machine algorithm for accurate and quick fault diagnosis.
The performance of Hybrid Electric Vehicles (HEVs), especially in series architecture, is highly dependent on the reliability of electric drive-motor systems. Any failure in power semiconductor devices, such as Insulated-Gate Bipolar Transistors (IGBTs), used in three-phase Voltage Source Inverters (VSIs) for Permanent Magnet Synchronous Motor (PMSM) drive systems, causes a reduction in the reliability and leads to unscheduled maintenance of HEVs. This paper aims to present a three-stage combined model-based and data-driven fault diagnosis approach, the so-called hybrid fault diagnosis approach, to detect, locate, and clear open-circuit faults in IGBTs used in VSI-fed PMSM drive systems in HEVs. Field-Oriented Control (FOC), which is a model-based technique, is used to control the electric drive-motor system. The proposed method, which is based on phase voltage analysis, estimates the current in each phase of VSI using the normal operating conditions dataset to detect open-circuit faults in IGBTs. Once a fault is detected, it is located using the faulty conditions dataset and an online data-driven approach, called the Modified Multi-Class Support Vector Machine (MMC-SVM) algorithm. Thereafter, the faulty IGBT is bypassed by closing the corresponding backup switch, ensuring the continuous operation of the electric drive-motor system. The proposed method can accurately and quickly detect, locate, and clear open-circuit faults in IGBTs without the need for additional sensors. Additionally, it demonstrates robustness against back-to-back and simultaneous faults in IGBTs used in VSI-fed PMSM drive systems in HEVs.
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