4.7 Article

In situ XRD and Raman study of the phase transition in V2O5 xerogels

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JOURNAL OF NON-CRYSTALLINE SOLIDS
卷 625, 期 -, 页码 -

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ELSEVIER
DOI: 10.1016/j.jnoncrysol.2023.122751

关键词

Amorphous materials; Xerogel; Vanadium oxide; Thin films; Raman scattering; X-ray diffraction

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In this study, vanadium oxide xerogel samples were successfully synthesized through a liquid phase reaction and the interaction of films with water. The samples were thoroughly analyzed using X-ray diffraction and Raman spectroscopy, revealing the existence of two distinct phases. It was also discovered that previous misinterpretations regarding the high-pressure polymorph structure were due to the formation of a high-temperature phase. These findings highlight the potential for further refining and expanding the current structural models of vanadium oxide xerogel in future research efforts.
Vanadium oxide xerogel samples (V2O5 center dot nH2O) were successfully synthesized using a liquid phase reaction between alpha-V2O5 and H2O2, as well as through the interaction of amorphous V2O5 films with atmospheric water. The samples were systematically investigated by X-ray diffraction and Raman spectroscopy. Temperature-dependent studies confirmed the existence of two distinct phases. Depending on synthesis and processing protocols, either phase can be stabilized in ambient conditions. It was proved that the formation of a high-temperature phase from amorphous vanadium oxide previously led to some misinterpretations associated with the high-pressure 6-V2O5 polymorph. While current structural models of vanadium oxide xerogel provide some insights, our findings underscore the exciting potential for refining and expanding these models in future research endeavors.

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