4.8 Article

Photon bunching in cathodoluminescence induced by indirect electron excitation

期刊

NANOSCALE
卷 15, 期 22, 页码 9738-9744

出版社

ROYAL SOC CHEMISTRY
DOI: 10.1039/d3nr00376k

关键词

-

向作者/读者索取更多资源

Impulsive excitation of excitons or color centers by high-energy electron beams results in photon bunching in cathodoluminescence microscopy, which can be used to study excited-state dynamics, excitation and emission efficiency of nanoscale materials, and interactions with nanophotonic cavities.
The impulsive excitation of ensembles of excitons or color centers by a high-energy electron beam results in the observation of photon bunching in the second-order correlation function of the cathodoluminescence generated by those emitters. Photon bunching in cathodoluminescence microscopy can be used to resolve the excited-state dynamics and the excitation and emission efficiency of nanoscale materials, and it can be used to probe interactions between emitters and nanophotonic cavities. Here, we report substantial changes in the measured bunching induced by indirect electron interactions (with indirect electron excitation inducing $g<^>{2}(0)$ values approaching $10<^>4$). This result is critical to the interpretation of $g<^>{2}(\tau)$ in cathodoluminescence microscopies, and, more importantly, it provides a foundation for the nanoscale characterization of optical properties in beam-sensitive materials.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.8
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据