A novel experimental procedure for lock-in thermography on solar cells

The occurrence of defects in solar cells is intrinsically related to a reduction in the efficiency and reliability of these devices. Therefore, monitoring techniques, such as lock-in thermography, electroluminescence and the I-V characteristic curve are adopted in order to evaluate the integrity of the solar cells. In the present work, a novel experimental procedure for the lock-in thermography of solar cells is proposed, aiming to improve the detection capability of the assay. Conventional techniques use pulse width modulation to operate the cell at a fixed point on the I-V curve. Instead, we propose a methodology based on a sinusoidal electric current excitation in order to extend the range of operational points that are close to the maximum power point as the cell operates in the field. Some traditional image processing techniques (principal component analysis, the fast Fourier transform and the four-step phase-shifting method) have been used to analyze the thermal images captured by an infrared camera during steady-state operation mode of the solar cells using both sinusoidal electric current signal and standard pulse width modulation procedures. Comparison between the results of both procedures found that this novel approach provides smoother and clearer delimitation of the defects. Furthermore, the contrast of the phase images was found to exhibit significant changes between the defective and non-defective regions for different modulation frequencies and types of defects. From the achieved results, it was possible to obtain a satisfactory characterization of the existing defects.

Automated summary

Defects in solar cells can reduce their efficiency and reliability. Monitoring techniques like lock-in thermography, electroluminescence, and I-V characteristic curve are utilized to assess the integrity of solar cells. This study proposes a novel experimental procedure for lock-in thermography of solar cells, using sinusoidal electric current excitation to improve defect detection capability. Results show that this approach provides smoother and clearer delimitation of defects compared to conventional methods.