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注意：仅列出部分参考文献，下载原文获取全部文献信息。Efficiency droop in light-emitting diodes: Challenges and countermeasures
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Measurement of electron overflow in 450 nm InGaN light-emitting diode structures
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Hot-phonon temperature and lifetime in a biased AlxGa1-xN/GaN channel estimated from noise analysis -: art. no. 035338
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Temperature and injection current dependence of electroluminescence intensity in green and blue InGaN single-quantum-well light-emitting diodes
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