期刊
AIP ADVANCES
卷 6, 期 3, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.4944839
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资金
- German State of Lower Saxony
- German Federal Ministry of Economics and Energy
- research project SolarLIFE [0325763C]
- Leibniz Universitat Hannover
We examine the carrier lifetime evolution of block-cast multicrystalline silicon (mc-Si) wafers under illumination (100 mW/cm(2)) at elevated temperature (75 degrees C). Samples are treated with different process steps typically applied in industrial solar cell production. We observe a pronounced degradation in lifetime after rapid thermal annealing (RTA) at 900 degrees C. However, we detect only a weak lifetime instability in mc-Si wafers which are RTA-treated at 650 degrees C. After completion of the degradation, the lifetime is observed to recover and finally reaches carrier life-times comparable to the initial state. To explain the observed lifetime evolution, we suggest a defect model, where metal precipitates in the mc-Si bulk dissolve during the RTA treatment. (C) 2016 Author(s).
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