期刊
OPTICS AND LASER TECHNOLOGY
卷 167, 期 -, 页码 -出版社
ELSEVIER SCI LTD
DOI: 10.1016/j.optlastec.2023.109767
关键词
3D measurement; Fringe projection profilometry; Two-neighbor-wavelength phase-shifting; Unwrapped phase retrieval
This paper presents a novel two-neighbor-wavelength fringe projection approach for fast and accurate 3D measurement. By encoding four fringe images, including two short-wavelength images and two long-wavelength images, the proposed approach significantly reduces the image acquisition time. Additionally, the difference in fringe period between short and long wavelength patterns improves the noise tolerance. The effectiveness and superiority of the method are demonstrated through static and dynamic experiments.
This paper presents a two-neighbor-wavelength fringe projection approach for high-accuracy fast 3D measurement. Different from the traditional two-wavelength fringe projection approach, the proposed approach encodes four fringe images, wherein two are short-wavelength images and the other two are long-wavelength images, which significantly reduces the time for the camera to collect images. And the short-wavelength pattern has one more fringe period than the long-wavelength pattern, which decreases the frequency ratio and extends the noise tolerance. Through a concise algorithm, the one-period reference phase and multiple periods wrapped phase are extracted simultaneously. The wrapped phase is unfolded through phase stairs derived from the reference phase, so as to retrieve the unwrapped phase. Both static and dynamic experiments demonstrate the effectiveness and superiority of our method.
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