期刊
IEEE SENSORS JOURNAL
卷 23, 期 6, 页码 5901-5910出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JSEN.2023.3240746
关键词
Electromagnetic pattern denoising; image processing; near-field scanning; noise analysis
A nonlocal noise removal technique, called block-matching 3-D (BM3D), is used to enhance the quality of a blurry electromagnetic pattern generated from a device's near field. The technique analyzes the noise distribution in the pattern and removes it in a 3-D transformation domain using sparse representation. The BM3D technique is validated on weak emission profile recovery, source localization in a field programmable gate array (FPGA), and pattern clustering in a double data rate (DDR) synchronous dynamic random access memory (SDRAM) integrated circuit (IC), demonstrating its effectiveness in near-field scanning patterns of a device.
A nonlocal noise removal technique, known as block-matching 3-D (BM3D), is introduced to improve the quality of a blurry electromagnetic pattern generated from near field of a device. Noise distribution in electromagnetic pattern is analyzed. Taking the nonlocal self-similarity into account, the BM3D technique removes the noise of the pattern in a 3-D transformation domain based on sparse representation. First, the noise removal technique was validated well on the profile recovery of weak emission of a microstrip line driven by a square wave. Then, the BM3D technique is applied to improve source localization in a field programmable gate array (FPGA) and also to improve pattern clustering in a double data rate (DDR) synchronous dynamic random access memory (SDRAM) integrated circuit (IC). Both the applications demonstrate the effectiveness of the BM3D noise removal technique in the near-field scanning patterns of a device.
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