期刊
MATERIALS
卷 9, 期 8, 页码 -出版社
MDPI
DOI: 10.3390/ma9080655
关键词
polymer blends; surface structures and chemical properties; ToF-SIMS; XPS
类别
资金
- Research Grants Council of the Hong Kong Special Administrative Region, China [600513, 16300314]
The surface properties of polymer blends are important for many industrial applications. The physical and chemical properties at the surface of polymer blends can be drastically different from those in the bulk due to the surface segregation of the low surface energy component. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary mass spectrometry (ToF-SIMS) have been widely used to characterize surface and bulk properties. This review provides a brief introduction to the principles of XPS and ToF-SIMS and their application to the study of the surface physical and chemical properties of polymer blends.
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