期刊
VACUUM
卷 131, 期 -, 页码 81-88出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.vacuum.2016.05.001
关键词
Secondary electron yield (SEY); TiZrV-Pd; Low SEY film coating; Secondary electroh emission (SEE)
资金
- National Nature Science Foundation of China [11475166]
- National Natural Science Funds of China [11205155]
- Fundamental Research Funds for the Central Universities [WK2310000041]
In particle accelerators, the build-up of electron cloud has an important influence on beam quality. Especially for the positron and proton accelerators, massive electrons lead to electron cloud, which affects the stability, energy, emittance and beam life adversely. A secondary electron emission (SEE) measurement system has been designed and used to study the SEE of palladium (Pd), TiZrV and TiZrV-Pd with an independently adjustable energy from 50 eV to 5 keV. Here, we obtained the characteristics of the SEE from Pd, TiZrV and TiZrV-Pd film coatings with different thickness under ultrahigh-vacuum (UHV) conditions. Moreover, the minimum maximum secondary electron yield (SEY), delta(max), of the Pd, TiZrV and TiZrV-Pd film coatings under different primary electron doses were 138, 1.51, and 1.52, respectively. Finally, the variation of the secondary electron yield with the incident electron energy will be discussed for Pd, TiZrV and TiZrV-Pd thin film coatings. (C) 2016 Elsevier Ltd. All rights reserved.
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