4.5 Article

Plasma-assisted polishing of gallium nitride to obtain a pit-free and atomically flat surface

期刊

CIRP ANNALS-MANUFACTURING TECHNOLOGY
卷 64, 期 1, 页码 531-534

出版社

ELSEVIER SCIENCE BV
DOI: 10.1016/j.cirp.2015.04.002

关键词

Polishing; Single crystal; Surface integrity

资金

  1. MEXT, Japan [25249006]
  2. JST
  3. [25-581 2013]
  4. Grants-in-Aid for Scientific Research [25249006, 13J00581] Funding Source: KAKEN

向作者/读者索取更多资源

Plasma-assisted polishing (PAP), which combines plasma modification and soft abrasive polishing, was used to flatten GaN. After the irradiation of CF4 plasma, GaN was modified to GaF3, greatly decreasing its surface hardness. The modified layer was removed by polishing using a CeO2 grindstone for surface flattening. It was revealed that while many pits were generated in conventional CMP using SiO2 or CeO2 slurry, which deteriorated the surface integrity and roughness of GaN, a pit-free and atomically flat GaN surface with a Sq roughness of 0.1 nm order was obtained by the application of PAP, which is a dry polishing process. (C) 2015 CIRP.

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