期刊
RELIABILITY ENGINEERING & SYSTEM SAFETY
卷 147, 期 -, 页码 84-92出版社
ELSEVIER SCI LTD
DOI: 10.1016/j.ress.2015.11.009
关键词
LED luminaire and lamp; Luminous flux depreciation; Lumen maintenance; Accelerated test; LM-80; Boundary curve
资金
- National High Tech Research and Development Program of China (863 Program) [2015AA03A101]
- International Science and Technology Cooperation Program of China [2015DFG52110]
- Natural Science Foundation of Jiangsu Province [BK20150249]
Light Emitting Diode (LED) luminaires and lamps are energy-saving and environmental friendly alternatives to traditional lighting products. However, current luminous flux depreciation test at luminaire and lamp level requires a minimum of 6000 h testing, which is even longer than the product development cycle time. This paper develops an accelerated test method for luminous flux depreciation to reduce the test time within 2000 h at an elevated temperature. The method is based on lumen maintenance boundary curve, obtained from a collection of LED source lumen depreciation data, known as LM-80 data. The exponential decay model and Arrhenius acceleration relationship are used to determine the new threshold of lumen maintenance and acceleration factor. The proposed method has been verified by a number of simulation studies and experimental data for a wide range of LED luminaire and lamp types from both internal and external experiments. The qualification results obtained by the accelerated test method agree well with traditional 6000 h tests. (C) 2015 Elsevier Ltd. All rights reserved.
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