期刊
PHYSICAL REVIEW LETTERS
卷 117, 期 2, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.117.024801
关键词
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资金
- DOE STTR Grant [DE-SC0013115]
- National Science Foundation [PHY-1415583]
- U.S. Department of Energy (DOE) [DE-SC0013115] Funding Source: U.S. Department of Energy (DOE)
- Direct For Mathematical & Physical Scien
- Division Of Physics [1415583, GRANTS:13701946] Funding Source: National Science Foundation
We present the results of an experiment where a short focal length (similar to 1.3 cm), permanent magnet electron lens is used to image micron-size features (of a metal sample) with a single shot from an ultrahigh brightness picosecond-long 4 MeV electron beam emitted by a radio-frequency photoinjector. Magnification ratios in excess of 30x were obtained using a triplet of compact, small gap (3.5 mm), Halbach-style permanent magnet quadrupoles with nearly 600 T/m field gradients. These results pave the way towards single-shot time-resolved electron microscopy and open new opportunities in the applications of high brightness electron beams.
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