期刊
OPTICS LETTERS
卷 42, 期 1, 页码 73-76出版社
OPTICAL SOC AMER
DOI: 10.1364/OL.42.000073
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资金
- European Research Council (ERC) [678316]
We present a dual-wavelength external holographic microscopy module for quantitative phase imaging of 3D structures with extended thickness range. This is done by simultaneous acquisition of two off-axis interferograms, each at a different wavelength, and generation of a synthetic wavelength, which is larger than the sample optical thickness, allowing two-wavelength unwrapping. The simultaneous acquisition is carried out by using optical multiplexing of the two interferograms onto the camera, where each of them has orthogonal off-axis interference fringe direction in relation to the other one. We used the system to quantitatively image a 7.96 mu m step target and 30.5 mu m circular copper pillars. (C) 2016 Optical Society of America
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