Modulus difference-induced embedding strategy to construct iontronic pressure sensor with high sensitivity and wide linear response range

Sensitivity and linearity are two crucial indices to assess the sensing capability of pressure sensors; unfortunately, the two mutually exclusive parameters usually result in limited applications. Although a series of microengineering strategies including micropatterned, multilayered, and porous approach have been provided in detail, the conflict between the two parameters still continues. Here, we present an efficient strategy to resolve this contradiction via modulus difference-induced embedding deformation. Both the microscopic observation and finite element simulation results confirm the embedding deformation behavior ascribed to the elastic modulus difference between soft electrode and rigid microstructures. The iontronic pressure sensor with high sensitivity (35 kPa(-1)) and wide linear response range (0-250 kPa) is further fabricated and demonstrates the potential applications in monitoring of high-fidelity pulse waveforms and human motion. This work provides an alternative strategy to guide targeted design of all-around and comprehensive pressure sensor.

Automated summary

Sensitivity and linearity are crucial indices to evaluate pressure sensors, but are often mutually exclusive, limiting their applications. This study proposes an effective strategy to resolve this contradiction through modulus difference-induced embedding deformation. Experimental results confirm the embedding deformation behavior related to the elastic modulus difference between soft electrode and rigid microstructures. The fabricated iontronic pressure sensor exhibits high sensitivity (35 kPa(-1)) and a wide linear response range (0-250 kPa), showing potential applications in monitoring high-fidelity pulse waveforms and human motion.