期刊
SMALL METHODS
卷 -, 期 -, 页码 -出版社
WILEY-V C H VERLAG GMBH
DOI: 10.1002/smtd.202300434
关键词
degradation mechanisms; light outcoupling; light-emitting diodes; perovskites; recombination dynamics
Perovskite light-emitting diodes (PeLEDs) show great potential for next-generation display and lighting applications due to their excellent optoelectronic properties. However, a systematic overview of the luminescence and degradation mechanisms is currently lacking. This study provides a detailed discussion of the photophysical processes, electroluminescence mechanism, and device degradation of perovskite materials and PeLEDs. Strategies to improve device performances, including optimization of photoluminescence quantum yield, charge injection and recombination, and light outcoupling efficiency, are also summarized. This work aims to guide future development of PeLEDs and facilitate their industrial applications.
Perovskite light-emitting diodes (PeLEDs) can be a promising technology for next-generation display and lighting applications due to their excellent optoelectronic properties. However, a systematical overview of luminescence and degradation mechanism of perovskite materials and PeLEDs is lacking. Therefore, it is crucial to fully understand these mechanisms and further improve device performances. In this work, the fundamental photophysical processes of perovskite materials, electroluminescence mechanism of PeLEDs including carrier kinetics and efficiency roll-off as well as device degradation mechanism are discussed in detail. In addition, the strategies to improve device performances are summarized, including optimization of photoluminescence quantum yield, charge injection and recombination, and light outcoupling efficiency. It is hoped that this work can provide guidance for future development of PeLEDs and ultimately realize industrial applications.
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