4.8 Article

Orientation Dependence of Electromechanical Characteristics of Defect-free InAs Nanowires

期刊

NANO LETTERS
卷 16, 期 3, 页码 1787-1793

出版社

AMER CHEMICAL SOC
DOI: 10.1021/acs.nanolett.5b04842

关键词

InAs nanowires; electrical properties; deformation; electron transmission microscope

资金

  1. National Natural Science Foundation of China [11374029, 61376015, 91321311]
  2. Foundation for the Author of National Excellent Doctoral Dissertation of PR China [201214]
  3. Beijing Nova Program [Z121103002512017]
  4. Key Project of National Natural Science Foundation of China [11234011]
  5. Henry Fok of the Ministry of Education Fund [141008]
  6. Beijing City Board of Education Project [KM201310005009]
  7. Australian Research Council

向作者/读者索取更多资源

Understanding the electrical properties of defect-free nanowires with so different structures and their responses under deformation are essential for design and applications of nanodevices and strain engineering. In this study, defect-free zinc-blende- and wurtzite-structured InAs nanowires were grown using molecular beam epitaxy, and individual nanowires with different structures and orientations were carefully selected and their electrical properties and electromechanical responses were investigated using an electrical probing system inside a transmission. electron microscope. Through our careful experimental design and detailed analyses, we uncovered several extraordinary physical phenomena, such as the electromechanical characteristics are dominated by the nanowire orientation, rather than its crystal structure. Our results provide critical insights into different responses induced by deformation of InAs with different structures, which is important for nanowire-based devices.

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