期刊
IEEE PHOTONICS JOURNAL
卷 15, 期 5, 页码 -出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JPHOT.2023.3309890
关键词
Surface plasmon polaritons; near-field microscopy; surface characterization; apertured probes
This study demonstrates the anisotropic generation of surface plasmons polaritons using a near-field apertured probe in collection mode. By analyzing the momentum components of the obtained near-field images, it is shown that the detected signal is mostly composed of near-field components.
Most recent studies centered on light-matter interactions at the nanoscale rely on near-field microscopy. Despite this, few works have been reported to date regarding the anisotropic generation of surface plasmons polaritons on metallic surfaces. This phenomenon is attributed exclusively to scattering near-field probes. This work is dedicated to demonstrating that the anisotropic generation of surface plasmons polaritons is not exclusive to scattering probes. Using a near-field apertured probe, in collection mode, we demonstrate the generation and detection of such phenomenon. By analyzing the momentum components of the obtained near-field images, it is demonstrated that the detected signal is mostly composed of near-field components. Therefore, our approach reduces the contribution of propagating modes, consequently easing the interpretation of near-field images.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据