Preparation of 82Se thin films with trigonal hexagonal crystal structure for in-beam nuclear structure experiments

We report a novel approach in producing and characterizing enriched isotopic selenium-82 (82Se) thin films with trigonal hexagonal crystal structure (t-82Se), the most thermodynamically stable form of the element. The ob-tained t-82Se thin films are used as targets in accelerator based nuclear structure experiments. Several 82Se thin films with thicknesses around 5 mg/cm2 (10.4 & mu;m) were deposited on 5 mg/cm2 (3 & mu;m) tantalum (Ta) foils by vacuum evaporation-condensation method. The condensed 82Se films exhibit unstable amorphous structure (a-82Se), therefore were converted to t-82Se by means of an appropriate vacuum heat treatment developed in the target laboratory of IFIN-HH. After the thermal treatment, the microstructure, morphology and composition of the 82Se films were evaluated before and after the vacuum thermal treatment using Fourier Transform Raman Spectroscopy (FT-Raman), X-Ray Diffraction (XRD), Atomic Force Microscopy (AFM), Scanning Electron Mi-croscopy (SEM) and Energy-Dispersive X-Ray Spectroscopy (EDX) techniques. Furthermore, an in-beam & gamma;-spectroscopy experiment performed at the 9-MV tandem accelerator of IFIN-HH confirmed that the ther-mally treated t-82Se films possess high durability and high purity with no detectable contamination and no mass loss.

Automated summary

This study presents a new method of producing and characterizing enriched isotopic selenium-82 (82Se) thin films with trigonal hexagonal crystal structure (t-82Se), which is the most thermodynamically stable form of the element. The obtained t-82Se thin films were used as targets in accelerator-based nuclear structure experiments. The microstructure, morphology, and composition of the 82Se films were evaluated using various techniques, and an in-beam γ-spectroscopy experiment confirmed the high durability and purity of the thermally treated t-82Se films.