期刊
VACUUM
卷 215, 期 -, 页码 -出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.vacuum.2023.112283
关键词
Graphene oxide; Reduction; Oxidation; X-rays irradiation; FTIR spectroscopy
Graphene oxide (GO) foils were exposed to X-rays in air and vacuum environments. Attenuated total reflectance (ATR) method for Fourier Transmission Infrared (FTIR) spectroscopy was used to analyze the GO foils before and after irradiation. X-ray exposure in air led to increased oxidation, while exposure in vacuum induced reduction of oxygen functional groups and removal of water. The effects of irradiation time and X-ray energy distribution on the variations of oxygen functional groups were investigated. Potential applications of GO reduction in ionization dosimetry, detectors, microelectronic devices, and membranes are discussed.
Graphene oxide (GO) foils have been exposed to X-rays in air and in vacuum. The attenuated total reflectance (ATR) method for Fourier Transmission Infrared (FTIR) spectroscopy has been used to analyze the pristine and the irradiated GO foils. The X-ray exposition in air produces oxidation increment, while in vacuum it induces reduction of the oxygen functional groups and partial removal of water. These processes have been investigated as a function of both the irradiation time and X-ray energy distribution highlighting the variations of some functional groups of oxygen. Some interesting applications of the GO reduction will be suggested in the field of ionization dosimetry, detectors, microelectronic devices, and membranes, as presented hereafter.
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