4.6 Article

Automated Interlayer Wall Height Compensation for Wire Based Directed Energy Deposition Additive Manufacturing

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SENSORS
卷 23, 期 20, 页码 -

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MDPI
DOI: 10.3390/s23208498

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wire-based directed energy deposition additive manufacturing (w-DEDAM); part quality monitoring and control; interlayer wall height compensation

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Part quality monitoring and control in wire-based directed energy deposition additive manufacturing (w-DEDAM) processes has been a topic of continuous interest. This paper investigates the behavior of interlayer deposition height in different wall regions, particularly the transition areas, when process parameters change. It also explores the potential of using geometry monitoring information for interlayer wall height compensation during w-DEDAM part-building.
Part quality monitoring and control in wire-based directed energy deposition additive manufacturing (w-DEDAM) processes has been garnering continuous interest from both the academic and industrial sectors. However, maintaining a consistent layer height and ensuring that the wall height aligns closely with the design, as depicted in computer-aided design (CAD) models, pose significant challenges. These challenges arise due to the uncertainties associated with the manufacturing process and the working environment, particularly with extended processing times. To achieve these goals in an industrial scenario, the deposition geometry must be measured with precision and efficiency throughout the part-building process. Moreover, it is essential to comprehend the changes in the interlayer deposition height based on various process parameters. This paper first examines the behaviour of interlayer deposition height when process parameters change within different wall regions, with a particular focus on the transition areas. In addition, this paper explores the potential of geometry monitoring information in implementing interlayer wall height compensation during w-DEDAM part-building. The in-process layer height was monitored using a coherent range-resolved interferometry (RRI) sensor, and the accuracy and efficiency of this measurement were carefully studied. Leveraging this information and understanding of deposition geometry, the control points of the process parameters were identified. Subsequently, appropriate and varied process parameters were applied to each wall region to gradually compensate for wall height. The wall height discrepancies were generally compensated for in two to three layers.

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