相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。Correlative Approach for Atom Probe Sample Preparation of Interfaces Using Plasma Focused Ion Beam Without Lift-Out
Vitor Vieira Rielli et al.
MICROSCOPY AND MICROANALYSIS (2022)
A review on atom probe and correlative microscopy studies of corrosion in nickel-based superalloys
C. Rodenkirchen et al.
MRS BULLETIN (2022)
Comparing Xe+pFIB and Ga+FIB for TEM sample preparation of Al alloys: Minimising FIB-induced artefacts
Xiangli Zhong et al.
JOURNAL OF MICROSCOPY (2021)
A versatile cryo-transfer system, connecting cryogenic focused ion beam sample preparation to atom probe microscopy
Chandra Macauley et al.
PLOS ONE (2021)
High-resolution terahertz-driven atom probe tomography
Angela Vella et al.
SCIENCE ADVANCES (2021)
Comparative Apex Electrostatics of Atom Probe Tomography Specimens
Qihua Zhang et al.
JOURNAL OF ELECTRONIC MATERIALS (2021)
Xenon plasma focussed ion beam preparation of an Al-6XXX alloy sample for atom probe tomography including analysis of an α-Al(Fe,Mn) Si dispersoid
J. R. Famelton et al.
MATERIALS CHARACTERIZATION (2021)
Evaporation-Field Differences with Deep-UV Atom Probe Tomography
Ty Prosa et al.
MICROSCOPY AND MICROANALYSIS (2021)
A review of defect engineering, ion implantation, and nanofabrication using the helium ion microscope
Frances I. Allen
BEILSTEIN JOURNAL OF NANOTECHNOLOGY (2021)
Atom probe tomography
Baptiste Gault et al.
NATURE REVIEWS METHODS PRIMERS (2021)
New approach for FIB-preparation of atom probe specimens for aluminum alloys
L. Lilensten et al.
PLOS ONE (2020)
Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light
Ann N. Chiaramonti et al.
MICROSCOPY AND MICROANALYSIS (2020)
An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focussed ion beam
J. E. Halpin et al.
ULTRAMICROSCOPY (2019)
Direct imaging of short-range order and its impact on deformation in Ti-6Al
Ruopeng Zhang et al.
SCIENCE ADVANCES (2019)
A Three-Dimensional Atom Probe Microscope Incorporating a Wavelength-Tuneable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light Source
Ann N. Chiaramonti et al.
MRS ADVANCES (2019)
Analyzing the channel dopant profile in next-generation FinFETs via atom probe tomography
Andrew J. Martin et al.
ULTRAMICROSCOPY (2018)
Interfaces and defect composition at the near-atomic scale through atom probe tomography investigations
Baptiste Gault et al.
JOURNAL OF MATERIALS RESEARCH (2018)
Review of electrohydrodynamical ion sources and their applications to focused ion beam technology
Jacques Gierak et al.
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B (2018)
Optimizing Atom Probe Analysis with Synchronous Laser Pulsing and Voltage Pulsing
Lu Zhao et al.
MICROSCOPY AND MICROANALYSIS (2017)
Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography
Ty J. Prosa et al.
MICROSCOPY AND MICROANALYSIS (2017)
Nature of gallium focused ion beam induced phase transformation in 316L austenitic stainless steel
R. Prasath Babu et al.
ACTA MATERIALIA (2016)
Evaluation of neon focused ion beam milling for TEM sample preparation
T. C. Pekin et al.
JOURNAL OF MICROSCOPY (2016)
Preparation and Analysis of Atom Probe Tips by Xenon Focused Ion Beam Milling
Robert Estivill et al.
MICROSCOPY AND MICROANALYSIS (2016)
Atom Probe Tomography on Semiconductor Devices
Mansoor Ali Khan et al.
ADVANCED MATERIALS INTERFACES (2016)
Direct observation of the thickness distribution of ultra thin AlOx barriers in Al/AlOx/Al Josephson junctions
L. J. Zeng et al.
JOURNAL OF PHYSICS D-APPLIED PHYSICS (2015)
Advances in source technology for focused ion beam instruments
Noel S. Smith et al.
MRS BULLETIN (2014)
Mechanisms of nanodot formation under focused ion beam irradiation in compound semiconductors
K. A. Grossklaus et al.
JOURNAL OF APPLIED PHYSICS (2011)
The neon gas field ion source-a first characterization of neon nanomachining properties
Richard H. Livengood et al.
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT (2011)
Effect of gallium focused ion beam milling on preparation of aluminium thin foils
K. A. Unocic et al.
JOURNAL OF MICROSCOPY (2010)
SRIM - The stopping and range of ions in matter (2010)
James F. Ziegler et al.
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS (2010)
Investigations of field-evaporated end forms in voltage- and laser-pulsed atom probe tomography
A. Shariq et al.
ULTRAMICROSCOPY (2009)
In situ site-specific specimen preparation for atom probe tomography
K. Thompson et al.
ULTRAMICROSCOPY (2007)
Helium ion microscope: A new tool for nanoscale microscopy and metrology
B. W. Ward et al.
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B (2006)