Low temperature densification and dielectric characterization of CeO2 ceramics

A near full densification is essential to obtain high dielectric constant and quality factor together with minimum dielectric loss for microwave dielectrics. Limited densification of CeO2 ceramics was improved by using 5 wt% anorthite-based glass and a high densification between 1050 degrees C and 1150 degrees C range (e.g., relative density 97.5-99%) was successfully obtained. Phase analysis revealed a cubic CeO2 phase without any crystalline sec-ondary phases formed. Dielectric properties followed the densification path such that maximum dielectric constant (minimum dielectric loss) was obtained at 1150 degrees C as 21.36 (0.0040) at 5 MHz. The unloaded quality factor (Q), resonance-frequency dependent quality factor (Qxf), and dielectric constant (loss) for a TEM mode dielectric resonator were calculated as 445, 1288 GHz, and 21 (0.0022), respectively. The CeO2-(anorthite-based) glass ceramic was studied for the first time in literature and the results are promising from the low temperature densification and microwave properties points of views.

Automated summary

The limited densification of CeO2 ceramics was improved by using an anorthite-based glass, resulting in high dielectric constant and quality factor with minimum dielectric loss. The CeO2-(anorthite-based) glass ceramic showed promising results in terms of low temperature densification and microwave properties.