4.6 Article

Cycle Characterization of SiO-Based Lithium-Ion-Batteries Using Real Load Profiles

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ELECTROCHEMICAL SOC INC
DOI: 10.1149/1945-7111/acfe9e

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This work presents a study on the cycle characterization of silicon-oxide-based (SiOx) cells, focusing on the impact of real load profiles and state-of-charge (SoC) ranges while varying the SiOx content in the cells. The experimental results demonstrate that the different SiOx content of the investigated cells and the SoC range significantly influence the cycle behavior of the cells, and cycling under high SoC conditions accelerates capacity fade and leads to higher SoH loss. The findings also indicate that SiO-based cells exhibited higher aging than traditional graphite-based cells, and the capacity fade rate increased at higher SiOx content.
Understanding the cyclic behavior of Lithium-Ion Batteries (LIBs) is crucial for optimizing their performance and extending their operational lifespan. This work presents a study on the cycle characterization of silicon-oxide-based (SiOx) cells, focusing on the impact of real load profiles and state-of-charge (SoC) ranges while varying the SiOx content in the cells. Various load profiles representing real usage patterns obtained from an industrial partner were applied to SiO-based pouch cells. These load profiles are represented over different SoC ranges to explore the effect of varying levels of charge/discharge on battery aging. The aging characteristics of the batteries are evaluated by monitoring capacity fade, state-of-health (SoH), and capacity end-point-slippage. The experimental results demonstrate that the different SiOx content of the investigated cells and the SoC range significantly influence the cycle behavior of the cells. The resulting capacity loss was affected especially by the anode overhang effect. Cycling under high SoC conditions accelerates capacity fade and leads to higher SoH loss. The findings also indicate that SiO-based cells exhibited higher aging than traditional graphite-based cells. The capacity fade rate increased at higher SiOx content.

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