相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。A correction for higher-order refraction in cathodoluminescence spectrometry
Michael Stoeger-Pollach et al.
ULTRAMICROSCOPY (2023)
Coherent light emission in cathodoluminescence when using GaAs in a scanning (transmission) electron microscope
Michael Stoeger-Pollach et al.
ULTRAMICROSCOPY (2021)
Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence
Michael Stoeger-Pollach et al.
ULTRAMICROSCOPY (2020)
Fundamentals of cathodoluminescence in a STEM: The impact of sample geometry and electron beam energy on light emission of semiconductors
Michael Stoeger-Pollach et al.
ULTRAMICROSCOPY (2019)
High power direct energy conversion by nuclear batteries
M. G. Spencer et al.
APPLIED PHYSICS REVIEWS (2019)
Radiation degradation prediction for InGaP solar cells by using appropriate estimation method for displacement threshold energy
Y. Okuno et al.
JOURNAL OF APPLIED PHYSICS (2017)
Valence EELS below the limit of inelastic delocalization using conical dark field EFTEM or Bessel beams
Michael Stoeger-Pollach et al.
ULTRAMICROSCOPY (2017)
Nano-cathodoluminescence reveals the effect of electron damage on the optical properties of nitride optoelectronics and the damage threshold
James T. Griffiths et al.
JOURNAL OF APPLIED PHYSICS (2016)
The Cerenkov limit of Si, GaAs and GaP in electron energy loss spectrometry
Michal Horak et al.
ULTRAMICROSCOPY (2015)
Optical properties and bandgaps from low loss EELS: Pitfalls and solutions
M. Stoeger-Pollach
MICRON (2008)
Treating retardation effects in valence EELS spectra for Kramers-Kronig analysis
A. Stoeger-Pollach et al.
ULTRAMICROSCOPY (2008)
Cerenkov losses: A limit for bandgap determination and Kramers-Kronig analysis
M. Stoeger-Pollach et al.
MICRON (2006)
A new understanding of near-threshold damage for 200 keV irradiation in silicon
N Stoddard et al.
JOURNAL OF MATERIALS SCIENCE (2005)
Valence excitations in electron microscopy: resolved and unresolved issues
A Howie
MICRON (2003)
Light emission from surfaces, thin films and particles induced by high-energy electron beam
N Yamamoto et al.
SURFACE AND INTERFACE ANALYSIS (2001)