Making chemical sense of phase in soft X-ray spectroptychography

Spectroptychography is being used to realize a significant improvement in the spatial resolution of x-ray spectromicroscopy, allowing chemical microanalysis at finer spatial scales. The chemical sensitivity of near edge Xray absorption fine structure (NEXAFS) is familiar to most researchers who use x-ray spectromicroscopy for chemical microanalysis. However, the additional phase information available through ptychography provides additional and tantalizing data, and potentially additional chemical information. This paper explores the chemical information available in phase for a system of silicon dioxide nanospheres.

Automated summary

Spectroptychography is used to improve the spatial resolution of x-ray spectromicroscopy for finer chemical microanalysis. Near edge X-ray absorption fine structure (NEXAFS) provides chemical sensitivity, while ptychography offers additional phase information and potential chemical information. This paper explores the chemical information available in phase for silicon dioxide nanospheres.