4.6 Article

Probabilistic-Bits Based on Ferroelectric Field-Effect Transistors for Probabilistic Computing

期刊

IEEE ELECTRON DEVICE LETTERS
卷 44, 期 8, 页码 1356-1359

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2023.3285525

关键词

FeFET; probabilistic-bit; probabilistic computing; dynamic model; multi-domain system

向作者/读者索取更多资源

A probabilistic bit (p-bit) is a random binary bitstream producer with tunable probability, and it is the crucial component of probabilistic computing circuitry. By utilizing the randomness induced by thermal noise-induced lattice vibration in the ferroelectric (FE) material, we propose p-bits based on stochastic ferroelectric FET (FeFET). The domain dynamic is found to be essential for the stochasticity of FE p-bits, as the domain coupling suppresses dipole fluctuation. Our proposed FE p-bits possess both extremely low hardware cost and scalability for p-bit circuitry, making it a promising candidate for PC.
A probabilistic bit (p-bit) is the fundamental building block in the circuit of probabilistic computing (PC), and it produces a random binary bitstream with tunable probability. Utilizing the randomness induced by thermal noise-induced lattice vibration in the ferroelectric (FE) material, we propose the p-bits based on stochastic ferroelectric FET (FeFET). The domain dynamic is revealed to play crucial roles in FE p-bits' stochasticity, as the domain coupling suppresses the dipole fluctuation. The proposed FE p-bits possess the advantages of both extremely low hardware cost and scalability for p-bit circuitry, rendering it a promising candidate for PC.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据