Dislocation Substructure in the Cold-Rolled Ni-20 Mass Pct Cr Alloy Analyzed by X-ray Diffraction, Positron Annihilation Lifetime, and Transmission Electron Microscopy

The systematic change in the dislocation density and characteristics that develop under cold rolling as a simulated deformation was studied in order to examine the fundamental behavior of dislocations in terms of the dislocation substructure formation. In particular, the dislocation density was quantified by X-ray line profile analysis (XLPA), which is effective for quantifying the dislocation density and character; positron annihilation lifetime (PAL), which is sensitive to vacancy-type lattice defects; the Bailey-Hirsch equation from the hardness (Hv); and transmission electron microscopy (TEM). The strain dependency of the dislocation density analyzed by XLPA, PAL, TEM, and Hv showed a similar tendency with an increase in the dislocation. In particular, the dislocation density by XLPA had good agreement with the results of TEM at low strain levels and with PAL at high strain levels. As a result, a combination of these techniques successfully showed the behavior of the dislocation substructure.