Fourier-DeepONet: Fourier-enhanced deep operator networks for full waveform inversion with improved accuracy, generalizability, and robustness

Full waveform inversion (FWI) infers the subsurface structure information from seismic waveform data by solving a non-convex optimization problem. Data-driven FWI has been increasingly studied with various neural network architectures to improve accuracy and computational efficiency. Nevertheless, the applicability of pre-trained neural networks is severely restricted by potential discrepancies between the source function used in the field survey and the one utilized during training. Here, we develop a Fourier-enhanced deep operator network (Fourier-DeepONet) for FWI with the generalization of seismic sources, including the frequencies and locations of sources. Specifically, we employ the Fourier neural operator as the decoder of DeepONet, and we utilize source parameters as one input of Fourier-DeepONet, facilitating the resolution of FWI with variable sources. To test Fourier-DeepONet, we develop three new and realistic FWI benchmark datasets (FWI-F, FWI-L, and FWI-FL) with varying source frequencies, locations, or both. Our experiments demonstrate that compared with existing data-driven FWI methods, Fourier-DeepONet obtains more accurate predictions of subsurface structures in a wide range of source parameters. Moreover, the proposed Fourier-DeepONet exhibits superior robustness when handling data with Gaussian noise or missing traces and sources with Gaussian noise, paving the way for more reliable and accurate subsurface imaging across diverse real conditions.& COPY; 2023 Elsevier B.V. All rights reserved.

Automated summary

Full waveform inversion (FWI) uses seismic waveform data to infer subsurface structure information. We propose a Fourier-enhanced deep operator network (Fourier-DeepONet) for FWI, which can handle varying source frequencies and locations. Compared with existing data-driven FWI methods, Fourier-DeepONet achieves more accurate predictions of subsurface structures under diverse source parameters.