Transmission Porosimetry Study on High-quality Zr-fum-MOF Thin Films

Crystalline Zr-fum-MOF (MOF-801) thin films of high quality are prepared on glass and silicon substrates by direct growth under solvothermal conditions. The synthesis is described in detail and the influence of different synthesis parameters such as temperature, precursor concentration, and the substrate type on the quality of the coatings is illustrated. Zr-fum-MOF thin films are characterized in terms of crystallinity, porosity, and homogeneity. Dense films of optical quality are obtained. The sorption behavior of the thin films is studied with various adsorptives. It can be easily monitored by measuring the transmission of the films in gas flows of different compositions. This simple transmission measurement at only one wavelength allows a very fast evaluation of the adsorption properties of thin films as compared to traditional sorption methods. The sorption behavior of the thin films is compared with the sorption properties of Zr-fum-MOF powder samples. Zr-fum-MOF thin films of high optical quality were synthesized using the solvothermal direct growth method. The optical properties of the thin films were investigated thoroughly in different gas atmospheres.+image

Automated summary

This article presents the synthesis of high-quality crystalline Zr-fum-MOF (MOF-801) thin films on glass and silicon substrates by direct growth under solvothermal conditions. The influence of different synthesis parameters on the film quality is investigated, including temperature, precursor concentration, and substrate type. The resulting films exhibit high optical quality and can be easily characterized in terms of crystallinity, porosity, and homogeneity. The sorption behavior of the films is studied using various adsorptives, and the transmission measurement at a single wavelength proves to be a fast and effective method for evaluating the adsorption properties. The sorption behavior of the films is compared with that of Zr-fum-MOF powder samples, and the optical properties of the films are thoroughly investigated.