Dual-Interface Engineering in Perovskite Solar Cells with 2D Carbides

Passivating the interfaces between the perovskite and charge transport layers is crucial for enhancing the power conversion efficiency (PCE) and stability in perovskite solar cells (PSCs). Here we report a dual-interface engineering approach to improving the performance of FA0.85MA0.15Pb(I0.95Br0.05)3-based PSCs by incorporating Ti3C2Clx Nano-MXene and o-TB-GDY nanographdiyne (NanoGDY) into the electron transport layer (ETL)/perovskite and perovskite/ hole transport layer (HTL) interfaces, respectively. The dual-interface passivation simultaneously suppresses non-radiative recombination and promotes carrier extraction by forming the Pb-Cl chemical bond and strong coordination of & pi;-electron conjugation with undercoordinated Pb defects. The resulting perovskite film has an ultralong carrier lifetime exceeding 10 & mu;s and an enlarged crystal size exceeding 2.5 & mu;m. A maximum PCE of 24.86 % is realized, with an open-circuit voltage of 1.20 V. Unencapsulated cells retain 92 % of their initial efficiency after 1464 hours in ambient air and 80 % after 1002 hours of thermal stability test at 85 & DEG;C. Two-dimensional (2D) carbides Ti3C2Clx Nano-MXene and o-TB-GDY NanoGDY are successfully employed to passivate the perovskite/electron transport layer (ETL) and perovskite/hole transport layer (HTL) interfaces, respectively. Due to significantly inhibited non-radiative recombination, enhanced energy band alignment, and improved charge-carrier extraction, the n-i-p devices obtain a high efficiency of 24.86 % with improved long-term stability.image

Automated summary

Passivating the interfaces between the perovskite and charge transport layers is crucial for enhancing the power conversion efficiency (PCE) and stability in perovskite solar cells (PSCs). In this study, a dual-interface engineering approach was used to improve the performance of FA0.85MA0.15Pb(I0.95Br0.05)3-based PSCs by incorporating Ti3C2Clx Nano-MXene and o-TB-GDY NanoGDY into the electron transport layer (ETL)/perovskite and perovskite/ hole transport layer (HTL) interfaces, respectively. The resulting perovskite film exhibited an ultralong carrier lifetime and an enlarged crystal size, leading to a high PCE of 24.86% and long-term stability.