Super-resolution Reflection Microscopy via Absorbance Modulation

In recent years, fluorescence microscopy has been revolutionized. Reversible switching of fluorophores has enabled circumventing the limits imposed by diffraction. Thus, resolution down to the molecular scale became possible. However, to the best of our knowledge, the application of the principles underlying super-resolution fluorescence microscopy to reflection microscopy has not been experimentally demonstrated. Here, we present the first evidence that this is indeed possible. A layer of photochromic molecules referred to as the absorbance modulation layer (AML) is applied to a sample under investigation. The AML-coated sample is then sequentially illuminated with a one-dimensional (1D) focal intensity distribution (similar to the transverse laser mode TEM01) at wavelength lambda(1) = 325 nm to create a subwavelength aperture within the AML, followed by illumination with a Gaussian focal spot at lambda(2) = 633 nm for high-resolution imaging. Using this method, called absorbance modulation imaging (AMI) in reflection, we demonstrate a 2.4-fold resolution enhancement over the diffraction limit for a numerical aperture (NA) of 0.65 and wavelength (lambda) of 633 nm.

Automated summary

In recent years, fluorescence microscopy has been revolutionized, enabling resolution down to the molecular scale. However, the application of super-resolution fluorescence microscopy to reflection microscopy has not been experimentally demonstrated. This study presents the first evidence that it is indeed possible and achieved a 2.4-fold resolution enhancement over the diffraction limit.