Nanocomposite Au/Si Cantilevers for Tip-Enhanced Raman Scattering (TERS) Sensors

In this study, we proposed and tested different procedures for the preparation of Au/Si cantilevers for Tip-enhanced Raman spectroscopy (TERS). The preparation of Au/Si TERS sensors was based on three methods: chemical (electroless) deposition, thermal evaporation of Au on the tip of commercially available cantilevers in a vacuum, and electrochemical etching of Au microwires. We fabricated and tested four types of TERS probes, and then used these probes for TERS measurements using graphene oxide (GO) as the target analyte. The probe tips were characterized using scanning electron microscopy (SEM). This article presents a comparative analysis of the fabrication methods, quality of the obtained probe tips, and enhancement factors (EFs) for the four types of TERS cantilevers (probes) produced by chemical deposition, sputtering, and electrochemical methods.

Automated summary

This study proposed and tested different methods for preparing Au/Si cantilevers for Tip-enhanced Raman spectroscopy (TERS). The preparation methods included chemical deposition, thermal evaporation, and electrochemical etching. Four types of TERS probes were fabricated and tested, and then used for TERS measurements using graphene oxide as the analyte. The probes were characterized using scanning electron microscopy (SEM). This article presents a comparative analysis of the fabrication methods, quality of the probe tips, and enhancement factors for the four types of TERS cantilevers.