期刊
BULLETIN OF THE KOREAN CHEMICAL SOCIETY
卷 44, 期 7, 页码 629-633出版社
WILEY-V C H VERLAG GMBH
DOI: 10.1002/bkcs.12704
关键词
absolute Raman cross-section; Raman; sulfur; the first principles density functional theory; thin film; ultralow frequency
Absolute Raman cross-sections are important for quantitative analyses of condensed phases. This study focuses on solid thin films with ultralow frequency Raman characteristics. A ULF Raman spectrometer is used to determine the absolute Raman cross-sections of an alpha-S-8 film and these measurements are confirmed using density functional theory. The results can be used as a quantitative standard for thin films with ULF Raman characteristics.
Absolute Raman cross-sections are widely used for quantitative analyses of condensed phases. However, solid thin films showing ultralow frequency (ULF) Raman characteristics at <100 cm(-1) have not been studied deeply. Herein, we demonstrate an ULF Raman spectrometer equipped with 488 and 785 nm pumped lasers and determine the absolute Raman cross-sections of 34-mu m-thick alpha-S-8 film, which presents Raman peaks at approximately 27, 50, 83, 154, and 220 cm(-1). These experimentally measured ultralow Raman frequencies and Raman cross-sections were also confirmed via first principles density functional theory. Thus, our Raman cross-section studies can be utilized as a quantitative standard for thin films showing ULF Raman characteristics.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据