Ptychographic measurements of varying size and shape along zeolite channels

Sub-angstrom resolution imaging of porous materials like zeolites is important to reveal their structure-property relationships involved in ion exchange, molecule adsorption and separation, and catalysis. Using multislice elec-tron ptychography, we successfully measured the atomic structure of zeolite at sub-angstrom lateral resolution for 100-nanometer-thick samples. Both lateral and depth deformations of the straight channels are mapped, showing the three-dimensional structural inhomogeneity and flexibility. Since most zeolites in industrial appli-cations are usually tens to hundreds of nanometers thick, the sub-angstrom resolution imaging and accurate measurements of depth-dependent local structures with electron ptychography at low-dose condition will find wide applications in porous materials close to their industrially relevant conditions.

Automated summary

Using multislice electron ptychography, the atomic structure of zeolite was measured at sub-angstrom lateral resolution, revealing two-dimensional and three-dimensional deformations of the channels. This method provides accurate measurements of depth-dependent local structures at low-dose condition, which can be widely applied to porous materials in industrial applications.