Soft X-ray spectro-ptychography of boron nitride nanobamboos, carbon nanotubes and permalloy nanorods

Spectro-ptychography offers improved spatial resolution and additional phase spectral information relative to that provided by scanning transmission X-ray microscopes. However, carrying out ptychography at the lower range of soft X-ray energies (e.g. below 200 eV to 600 eV) on samples with weakly scattering signals can be challenging. Here, results of soft X-ray spectro-ptychography at energies as low as 180 eV are presented, and its capabilities are illustrated with results from permalloy nanorods (Fe 2p), carbon nanotubes (C 1s) and boron nitride bamboo nanostructures (B 1s, N 1s). The optimization of low-energy X-ray spectro-ptychography is described and important challenges associated with measurement approaches, reconstruction algorithms and their effects on the reconstructed images are discussed. A method for evaluating the increase in radiation dose when using overlapping sampling is presented.

Automated summary

The challenges and importance of soft X-ray spectro-ptychography in the low-energy range are discussed. Results of low-energy soft X-ray spectro-ptychography at 180 eV are presented, showcasing its capabilities on various nanostructures. The optimization of low-energy X-ray spectro-ptychography, challenges in measurement approaches and reconstruction algorithms, as well as the evaluation of radiation dose increase with overlapping sampling, are discussed.