Crystallographic, Structural, and Electrical Properties of W6+ Substituted with Mo6+ in Crystalline Phases such as TTB Structure

Owing to their low dielectric loss and high permittivity values, dielectric ceramics have garnered a lot of interest from the scientific and industrial sectors. These properties allow for their downsizing and use in a variety of electronic circuits. This present work focuses on the impact of the substitution of W6+ with Mo6+ on the structural and dielectric features of the crystalline phases in a similar TTB structure within the Ba0.54Na0.46Nb1.29W(0.37-x)MoxO5 system, with 0 <= x <= 0.33 mol%. These crystalline phases were elaborated using the conventional solid-state reaction method and analyzed with XRD, Raman, and dielectric techniques. The Rietveld refinement method showed that all these phases are characterized by tetragonal structure and the P4bm space group. The Raman spectra corresponded well to a TTB-like structure, and all the bands were assigned. The dielectric measurements of the prepared ceramic samples facilitated the determination of their phase transition temperature (T-c) and the dielectric responses. This investigation focused on determining dielectric permittivity (epsilon ') and its correlation with increases in MoO3 content in the ceramic structure.

Automated summary

Dielectric ceramics have attracted much attention due to their low dielectric loss and high permittivity values, making them suitable for downsizing and use in various electronic circuits. This study focuses on the substitution of W6+ with Mo6+ in the Ba0.54Na0.46Nb1.29W(0.37-x)MoxO5 system and its impact on the structural and dielectric features of the crystalline phases. The crystalline phases were prepared using solid-state reaction method and analyzed through XRD, Raman, and dielectric techniques.