Critical Current Degradation in HTS Tapes for Superconducting Fault Current Limiter under Repeated Overcurrent

Superconducting fault current limiters (SFCL) can be an alternative to conventional devices limiting short-circuit currents in power systems. SFCL use high-temperature superconducting tapes of the second generation (HTS 2G) in SFCL, which, after reaching the characteristic critical current of the tape, go into the resistive state (quenching), limiting the short-circuit current. The critical current determines the moment of activation of the SFCL. Therefore, its value should not change during the operation of the device due to repeated limitation of short-circuit currents. The constancy of the critical current is a prerequisite for proper cooperation with the power system protection devices. Multiple quenching can cause microdamage in the superconducting layers responsible for lowering of the value of the critical current of the HTS tapes. The article presents the research results on the degradation processes of 2G HTS tapes intended for the construction of SFCL due to the action of prospective short-circuit currents with values exceeding the critical current of the tested tapes. The decrease in the value of the critical current of the HTS tape as a result of multiple transitions to the resistive state was investigated. The amount of energy emitted during the test current pulse of 0.2 s duration was determined. The limitation values of the voltage drop on the tape, which does not cause accelerated degradation processes, were defined. The microstructural tests of cross-sections of new HTS tapes subjected to prospective short-circuit currents were performed.

Automated summary

Superconducting fault current limiters (SFCL) using high-temperature superconducting tapes of the second generation (HTS 2G) can replace traditional devices in power systems to limit short-circuit currents. The critical current of the HTS tape determines the activation of the SFCL and should remain constant to ensure proper cooperation with power system protection devices. The article presents research results on the degradation processes of 2G HTS tapes due to prospective short-circuit currents exceeding the critical current, including the decrease in critical current value and determination of limitation values of voltage drop that do not cause accelerated degradation processes.