期刊
ULTRAMICROSCOPY
卷 247, 期 -, 页码 -出版社
ELSEVIER
DOI: 10.1016/j.ultramic.2023.113702
关键词
Atomic resolution scanning transmission; electron microscopy; Atom-counting; 3D atomic modelling; Energy dispersive X-ray spectroscopy; Nanoparticle dynamics
类别
This paper provides an overview of the atom-counting methodology and its applications in the past decade. The detailed procedure to count the number of atoms is discussed, along with methods to improve its performance. Furthermore, advancements in mixed element nanostructures, 3D atomic modeling based on atom-counting results, and quantification of nanoparticle dynamics are highlighted.
Quantitative structure determination is needed in order to study and understand nanomaterials at the atomic scale. Materials characterisation resulting in precise structural information is a crucial point to understand the structure-property relation of materials. Counting the number of atoms and retrieving the 3D atomic structure of nanoparticles plays an important role here. In this paper, an overview will be given of the atom-counting methodology and its applications over the past decade. The procedure to count the number of atoms will be discussed in detail and it will be shown how the performance of the method can be further improved. Furthermore, advances toward mixed element nanostructures, 3D atomic modelling based on the atom-counting results, and quantifying the nanoparticle dynamics will be highlighted.
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