期刊
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
卷 34, 期 3, 页码 -出版社
A V S AMER INST PHYSICS
DOI: 10.1116/1.4946046
关键词
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Recent applications of hard x-ray photoelectron spectroscopy (HAXPES) demonstrate its many capabilities in addition to several of its limitations. Examples are given, including measurement of buried interfaces and materials under in situ or in operando conditions, as well as measurements under x-ray standing-wave and resonant excitation. Physical considerations that differentiate HAXPES from photoemission measurements utilizing soft x-ray and ultraviolet photon sources are also presented.
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