Topography and mechanical measurements of primary Schwann cells and neuronal cells with atomic force microscope for understanding and controlling nerve growth

Peripheral nerve injuries require a piece of substantial information for a satisfactory treatment. The prior pe-ripheral nerve injury knowledge, can improve nerve repair, and its growth at molecular and cellular level. In this study, we employed an atomic force microscope (AFM) to investigate the topography and mechanical properties of the primary Schwann cells and neuronal cells. Tapping mode images and contact points force-volume maps provide the cells topography. Two different probes were used to acquire the micro and nanomechanical prop-erties of the primary Schwann cells, NG-108-15 neuronal cells, and growth cones. Moreover, the sharp probe was only used to investigate neurites nanomechanics. A significant difference in the elastic moduli found between primary Schwann cells, and neuronal cells, with both probes, with consistent results. The elastic moduli of the growth cones were found higher, than the neuronal cells and primary Schwann cells, with both probes. Furthermore, the modulus variations were also found between neurites. These results have significant implica-tions for a better understanding of the peripheral nerve system (PNS) in terms of defining the optimal pattern surface and nerve guidance conduits.

Automated summary

The study used an atomic force microscope (AFM) to examine the topography and mechanical properties of primary Schwann cells and neuronal cells. The findings revealed significant differences in elastic moduli between primary Schwann cells and neuronal cells, as well as higher elastic moduli in growth cones compared to neuronal cells and primary Schwann cells. These results have important implications for understanding the peripheral nerve system (PNS) and optimizing surface patterns and nerve guidance conduits.