4.6 Article

Controlling the heat, flow, and oxygen transport by double-partitions during continuous Czochralski (CCz) silicon crystal growth

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ELSEVIER SCI LTD
DOI: 10.1016/j.mssp.2022.107235

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Continuous Czochralski; Oxygen transport; Silicon single crystal; Convection; Diffusion

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This study investigates the numerical effect of the depths of two partitions on heat, flow, and oxygen transport during the CCz growth of an 8-inch diameter silicon crystal. The different depths of the partitions influence the effective wall surface area, which is the main source of oxygen at the growth interface, as well as the melt motion and heat transfer within the crucible. The diffusion and convection of oxygen from the partitions and crucible wall towards the free surface and crystal-melt interface are also affected. The choice of at least one long partition prevents the entry of unmelted granular silicon into the melt region under the crystal-melt interface. A comparison of different cases shows that longer partition near the crystal-melt interface (90 mm) and shorter partition near the crucible sidewall (40 mm) result in lower power consumption and oxygen content along the growth interface.
The effect of the depths of two partitions on the heat, flow, and oxygen transport during the CCz growth of an 8 -inch diameter silicon crystal is numerically investigated. A crucible in which two partitions are immersed in the silicon melt is so-called a triple-crucible. The different depths of two partitions change the effective wall surface area, which is the main source of oxygen at the growth interface, melt motion, and heat transfer within the crucible. The diffusion and convection of oxygen from the partitions and crucible wall towards the free surface and the crystal-melt (c-m) interface are also affected. The amount of oxygen that dissolves from the effective wall surface into the melt is proportional to the surface temperature and the surface area. The choice of at least one long partition will prevent the entry of unmelted granular silicon into the melt region under the c-m interface. Comparison of various cases shows that when the partition near the c-m interface is longer (90 mm) and the partition near the crucible sidewall is shorter (40 mm), the power consumption and the content of oxygen along the growth interface are lower.

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