期刊
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
卷 157, 期 -, 页码 -出版社
ELSEVIER SCI LTD
DOI: 10.1016/j.mssp.2023.107322
关键词
Low dose X-ray sensor; Direct conversion X-ray sensors; Nanocrystalline semiconductor; Multiple scattering process
Low-dose X-ray sensors play a crucial role in healthcare applications, but their sensitivity is limited by the crystallite morphology of the attenuating materials. This study uses bismuth oxide (Bi2O3) to investigate the effect of grain size on direct conversion X-ray induced photocurrent at low doses. The sensitivity of nanocrystalline Bi2O3 is found to be superior to bulk-Bi2O3 due to the multiple scattering process, as discussed in detail.
Low-dose X-ray sensors are essential in healthcare applications, especially for diagnostic and therapeutic pur -poses. The highly sensitive X-ray sensors at low doses are significantly limited by the crystallite morphology of the attenuating materials. Bismuth oxide (Bi2O3) with unique functional properties was used to understand the influence of grain size on direct conversion X-ray induced photocurrent at low dose X-rays (mGy). Hence, a commercial nano-Bi2O3 and bulk-Bi2O3 were developed into a thick film on top of the interdigitated electrode by glass rod sliding technique. The photocurrent instigated for nano-Bi2O3 and bulk-Bi2O3 thick films at different low doses under 3 V biased condition was examined using 70 keV dental X-ray machine. The obtained sensitivity for nanocrystalline Bi2O3 was superior than the bulk-Bi2O3 due to the multiple scattering process, which was discussed in detail.
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