Determining the size of the overlapping area for image stitching in dark-field detection

Article Optics

Influence of light polarization state on the imaging quality of dark-field imaging system

Dan Chen et al.

Summary: This paper investigates the use of annular linear polarized light as the illumination source in a reflective dark-field detection system. The influence of the light's polarization state on the intensity distribution of scattered light is analyzed based on the theories of bidirectional reflectance distribution function and multi-beam interference. A simulation model of dark-field imaging is established using the finite-difference time-domain method to study surface defects. The near-field and far-field scattering intensity distributions caused by surface defects are calculated under different illumination conditions. The incidence angle and polarization state of the illuminated light are optimized. Simulation and experimental results demonstrate that the optimized illumination scheme, with P-polarized light at an incident angle of 45 degrees, minimally affects the interference effect and achieves higher measurement accuracy for the dark-field imaging detection system.

JOURNAL OF OPTICS (2022)

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Review Computer Science, Artificial Intelligence

A review of multimodal image matching: Methods and applications

Xingyu Jiang et al.

Summary: This paper introduces the fundamental problem of multimodal image matching and analyzes existing research methods and applications. It then provides a detailed summary and comparison of multimodal image matching methods in different research fields, and outlines future trends in related areas.

INFORMATION FUSION (2021)

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Proceedings Paper Optics

Optical element surface defects detection and quantitative evaluation standard based on dark-field imaging

Yongying Yang et al.

Summary: The study summarizes the optical element surface defects detection method based on dark-field imaging system, including details of plane and sphere optical element surface defects detection, involving surface adjustment, image acquisition, feature extraction, defect detection steps, and report output based on specific standards. In addition, the China National Standard proposed by our team on digitized quantitative measurement of defects is introduced.

TWELFTH INTERNATIONAL CONFERENCE ON INFORMATION OPTICS AND PHOTONICS (CIOP 2021) (2021)

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Article Chemistry, Analytical