期刊
JOURNAL OF MATHEMATICAL ANALYSIS AND APPLICATIONS
卷 529, 期 2, 页码 -出版社
ACADEMIC PRESS INC ELSEVIER SCIENCE
DOI: 10.1016/j.jmaa.2023.127226
关键词
C*-algebra; Positive cone; Hellinger and Bures metrics; Distance measure; Tracial linear functional; Operator mean
In this paper, a parametric family of two-variable maps on positive cones of C*-algebras is defined and studied from various perspectives. The square roots of the values of these maps under a faithful tracial positive linear functional are considered as a family of potential distance measures. The study explores the problem of well-definedness and whether these distance measures are true metrics, and also provides some related trace characterizations. Several difficult open questions are formulated.
In this paper we define a parametric family of certain two-variable maps on positive cones of C*-algebras. The square roots of the values of those maps under a faithful tracial positive linear functional (in the cases where the square roots are well defined, i.e., those values are non-negative real numbers on the whole cones) as two-variable numerical functions can be considered as a family of potential distance measures which includes the well known Hellinger and Bures metrics. We study that family from various points of view. The main questions concern the mentioned problem of well-definedness and, whenever we have an affirmative answer to that question, the problem whether those distance measures are true metrics. Besides, we obtain some related trace characterizations. Our study is not complete, we formulate a few probably quite difficult open questions.(c) 2023 Elsevier Inc. All rights reserved.
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