☆ 4.6 Article

Influence of thermal treatment duration on the morphological and optical properties of a-IGZO

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS (2023)

相关参考文献

注意：仅列出部分参考文献，下载原文获取全部文献信息。

Article Computer Science, Information Systems

Improved Electrical and Optical Properties of IGZO Transparent Conductive Oxide Due to Microwave Treatment: Application to Silicon Solar Cells

Myoungsu Chae et al.

Summary: The electrical and optical properties of IGZO-based transparent conductive oxide (TCO) were optimized using post microwave treatment (MWT), resulting in improved transmittance, lower sheet resistance, and increased current density. The increase in conductivity was attributed to the increase in oxygen vacancy within IGZO-based TCO. The applicability of IGZO-based TCO in solar cells was confirmed through short circuit current density analysis.

IEEE ACCESS (2022)

添加到收藏夹

Article Materials Science, Multidisciplinary

Tailoring In2Ga2ZnO7 thin film properties by annealing time effect

Nabihah Kasim et al.

Summary: The properties of indium gallium zinc oxide (In2Ga2ZnO7) thin films on silicon substrate prepared using sol-gel method in response to annealing time were thoroughly studied. Post-annealing treatment for different times resulted in changes in surface morphologies, film thickness, and optical energy bandgap. Longer annealing time of 60 minutes encouraged the formation of an interfacial layer on the underlying Si substrate, leading to a larger leakage current.

MATERIALS CHEMISTRY AND PHYSICS (2021)

添加到收藏夹

Article Physics, Condensed Matter

Refractive index of WO3 thin films grown under various temperatures determined by the Swanepoel method

Ion Tirca et al.

Summary: Tungsten oxide films deposited on quartz substrates by reactive pulsed laser deposition technique exhibit well-defined crystalline structure and optical properties.

PHYSICA B-CONDENSED MATTER (2021)

添加到收藏夹

Article Physics, Multidisciplinary

Accuracy of Swanepoel Method in Calculation of Polymer Film Thicknesses

Sarunrit Kesornkhup et al.

Summary: The study examined the accuracy of the Swanepoel method in calculating the thickness of spin-coated polymer films, revealing that films with higher solution concentrations or slower spin-coating speeds tend to be thicker. Errors between Swanepoel and actual thickness were mainly influenced by film surface roughness.

ACTA PHYSICA POLONICA A (2021)

添加到收藏夹

Article Materials Science, Ceramics

Effect of film growth thickness on the refractive index and crystallization of HfO2 film

Jianping Hu et al.

Summary: The study revealed that the refractive index of HfO2 film changes with the increasing growth thickness, closely related to variations in grain size and crystallization. As the thickness increases from 5 nm to 350 nm, the average refractive index at 633 nm decreases from 1.97 to 1.84, while the crystallinity increases from zero to 74%. A critical growth thickness of around 130 nm marks the transition of film structure from amorphous to polycrystalline monoclinic.

CERAMICS INTERNATIONAL (2021)

添加到收藏夹

Article Engineering, Electrical & Electronic

Effect of annealing temperature on physical and electrical properties of solution-processed polycrystalline In2Ga2ZnO7 thin film

Nabihah Kasim et al.

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS (2020)

添加到收藏夹

Article Chemistry, Inorganic & Nuclear

Tauc-plot scale and extrapolation effect on bandgap estimation from UV-vis-NIR data - A case study of beta-Ga2O3

P. R. Jubu et al.

JOURNAL OF SOLID STATE CHEMISTRY (2020)

添加到收藏夹

Article Engineering, Electrical & Electronic

Effect of IGZO thin films fabricated by Pulsed-DC and RF sputtering on TFT characteristics

Jaemin Kim et al.

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING (2020)

添加到收藏夹

Article Materials Science, Multidisciplinary

Determining the refractive index and the dielectric constant of PPDT2FBT thin film using spectroscopic ellipsometry

Chandan Howlader et al.

OPTICAL MATERIALS (2020)

添加到收藏夹

Article Materials Science, Multidisciplinary

Optical and electronic properties for As-60 at.% S uniform thickness of thin films: Influence of Se content

Ammar Qasem et al.

OPTICAL MATERIALS (2020)

添加到收藏夹

Article Engineering, Electrical & Electronic

Impact of the annealing time on physical properties of sprayed In2S3 thin films

N. Bouguila et al.

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS (2019)

添加到收藏夹

Article Chemistry, Physical

Investigation of growth characteristics, compositions, and properties of atomic layer deposited amorphous Zn-doped Ga2O3 films

Jiajia Tao et al.

APPLIED SURFACE SCIENCE (2019)

添加到收藏夹

Article Engineering, Electrical & Electronic

Effect of thickness and post deposition annealing temperature on the structural and optical properties of thermally evaporated molybdenum oxide films

Dibya Jyoti Borah et al.

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING (2019)

添加到收藏夹

Article Chemistry, Physical

Revisit of amorphous semiconductor InGaZnO4 : A new electron transport material for perovskite solar cells

Zhenggang Rao et al.

JOURNAL OF ALLOYS AND COMPOUNDS (2019)

添加到收藏夹

Article Materials Science, Multidisciplinary

Effect of annealing time on the structural and optical properties of n-CuO thin films deposited by sol-gel spin coating technique and its application in n-CuO/p-Si heterojunction diode

Richa Singh et al.

THIN SOLID FILMS (2019)

添加到收藏夹

Article Materials Science, Multidisciplinary

Preparation and optoelectronic properties of a-IGZO thin films deposited by RF magnetron sputtering at different working pressures

Rui-Xin Ma et al.

RARE METALS (2018)

添加到收藏夹

Review Materials Science, Coatings & Films

Review Article: Atomic layer deposition for oxide semiconductor thin film transistors: Advances in research and development

Jiazhen Sheng et al.

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A (2018)

添加到收藏夹

Article Physics, Applied

Densification of a-IGZO with low-temperature annealing for flexible electronics applications

J. G. Troughton et al.

APPLIED PHYSICS LETTERS (2017)

添加到收藏夹

Article Chemistry, Physical

A new method for calculating the refractive index of semiconductor thin films retrieved from their transmission spectra

M. Emam-Ismail et al.

JOURNAL OF ALLOYS AND COMPOUNDS (2016)

添加到收藏夹

Article Engineering, Electrical & Electronic

Optical characterization of a-IGZO thin film for simulation of a-IGZO(n)/μ-Si(p) heterojunction solar cell

F. Azri et al.

OPTICAL AND QUANTUM ELECTRONICS (2016)

添加到收藏夹

Article Chemistry, Physical

Substrate temperature dependent structural, optical and electrical properties of amorphous InGaZnO thin films

X. F. Chen et al.

JOURNAL OF ALLOYS AND COMPOUNDS (2015)

添加到收藏夹

Article Chemistry, Multidisciplinary

Effect of the annealing temperature and time of the particle size of tin dioxide

P. A. Matveeva et al.

RUSSIAN JOURNAL OF GENERAL CHEMISTRY (2015)

添加到收藏夹

Article Materials Science, Multidisciplinary

Thickness Dependence of Optical Properties of Amorphous Indium Gallium Zinc Oxide Thin Films: Effects of Free-Electrons and Quantum Confinement

X. D. Li et al.

ECS SOLID STATE LETTERS (2015)

添加到收藏夹

Article Materials Science, Ceramics

Sol-gel derived amorphous/nanocrystalline MgZnO thin films annealed by atmospheric pressure plasma jets

Shao-Tzu Lien et al.

CERAMICS INTERNATIONAL (2014)

添加到收藏夹

Article Chemistry, Physical

Modulation of optical and electrical properties of sputtering-derived amorphous InGaZnO thin films by oxygen partial pressure

X. F. Chen et al.

JOURNAL OF ALLOYS AND COMPOUNDS (2014)

添加到收藏夹

Article Engineering, Electrical & Electronic

Effect of annealing time on the structural, optical and electrical characteristics of DC sputtered ITO thin films

S. D. Senol et al.

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS (2014)

添加到收藏夹

Article Materials Science, Multidisciplinary

Enhancement of electrical stability of a-IGZO TFTs by improving the surface morphology and packing density of active channel

Jayapal Raja et al.

CURRENT APPLIED PHYSICS (2013)

添加到收藏夹

Article Engineering, Electrical & Electronic

Effect of annealing temperature on optical and electrical properties of ZrO2-SnO2 nanocomposite thin films

V. S. Anitha et al.

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS (2013)

添加到收藏夹

Article Physics, Applied

Structural relaxation in amorphous oxide semiconductor, a-In-Ga-Zn-O

Keisuke Ide et al.

JOURNAL OF APPLIED PHYSICS (2012)

添加到收藏夹

Article Materials Science, Multidisciplinary

Strain-arranged structure in amorphous films

Vera Lyahovitskaya et al.

JOURNAL OF MATERIALS RESEARCH (2012)

添加到收藏夹

Article Materials Science, Multidisciplinary

Effects of Substrate Temperature on Structural, Electrical and Optical Properties of Amorphous In-Ga-Zn-O Thin Films

Anup Thakur et al.

ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY (2012)

添加到收藏夹

Proceedings Paper Materials Science, Multidisciplinary

A Study of Annealing Time Effects on the Properties of Al:ZnO

Xue Shu-wen

INTERNATIONAL CONFERENCE ON SOLID STATE DEVICES AND MATERIALS SCIENCE (2012)

添加到收藏夹

Article Materials Science, Multidisciplinary

Effect of thermal annealing time on optical and structural properties of TeO2 thin films

T. Siciliano et al.

VACUUM (2010)

添加到收藏夹

Article Chemistry, Physical

Optical properties of glasses (TeO2-GeO2-K2O) thin films co-doped with rare earth oxides Sm2O3/Yb2O3

M. EI-Hagary et al.

JOURNAL OF ALLOYS AND COMPOUNDS (2009)

添加到收藏夹

Article Physics, Applied

Determination of the optical band gap for amorphous and nanocrystalline copper oxide thin films prepared by SILAR technique

M. Abdel Rafea et al.

JOURNAL OF PHYSICS D-APPLIED PHYSICS (2009)

添加到收藏夹

Article Metallurgy & Metallurgical Engineering

Effect of sputtering pressure and rapid thermal annealing on optical properties of Ta2O5 thin films

Zhou Ji-cheng et al.

TRANSACTIONS OF NONFERROUS METALS SOCIETY OF CHINA (2009)

添加到收藏夹

Article Chemistry, Physical

Determination of optical properties in nanostructured thin films using the Swanepoel method

J. Sanchez-Gonzalez et al.

APPLIED SURFACE SCIENCE (2006)

添加到收藏夹

© Peeref 2019-2024. All rights reserved.