期刊
CERAMICS INTERNATIONAL
卷 41, 期 2, 页码 2353-2360出版社
ELSEVIER SCI LTD
DOI: 10.1016/j.ceramint.2014.10.046
关键词
Microstructure-final; X-ray methods; SiO2; Refractories; P2O5
资金
- ANR (Agence Nationale de la Recherche, France)
- PNRB (Programme National de Recherche sur les Bioenergies)
The SiO2-P2O5 binary system is not well known. The aim of this work is to enhance the description of this quasibinary system. Volatilization of phosphorus, liquidus temperatures and phases crystallization were studied by TGA, X-ray diffraction, NMR and SEM after quenching systems of two compositions (50 wt% SiO2-50 wt% P2O5 and 75 wt% SiO2-25 wt% P2O5). At high temperature ( > 950 degrees C), volatilization of phosphorus in the SiO2-P2O5 binary system occurs. The liquidus temperatures are close to the ones proposed in the literature. The experimental results show the crystallization of SiP2O7 in four different polymorphs and the formation of the Si5O(PO4)(6) oxide phase. (C) 2014 Elsevier Ltd and Techna Group S.r.l. All rights reserved.
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